Iddq Testability Analysis Using Random Test Vectors

نویسندگان

  • Von-Kyoung Kim
  • Tom Chen
چکیده

This paper reports an investigation of Iddq test coverage of randomly generated test vectors and Iddq fault coverage estimation based on a new testability measure. Experimental results show that Iddq random vectors are as efficient as deterministic vectors, and that the proposed testability measure is capable of accurately estimating fault coverage of Iddq test.

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تاریخ انتشار 1997